Also, AFE circuit 221 is arranged to perform analog front end processing on signal Vmeas, and to provide signal ADCIN in response to the processing. G01K15/00- Testing or calibrating of thermometersĬonversion circuit 220 is arranged to provide signal Temp from voltage Vmeas, based on control by control circuit 216.using thermoelectric elements using semiconducting elements having PN junctions G01K7/01- Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat Power supply therefor, e.g.G01K7/00- Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat Power supply therefor, e.g.G01K- MEASURING TEMPERATURE MEASURING QUANTITY OF HEAT THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR.
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Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.) Active, expires Application number US10/952,514 Inventor Mehmet Aslan Chungwai Benedict Ng Eric Tam Qing Feng Ren Dan D'Aquino Current Assignee (The listed assignees may be inaccurate.
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Google Patents Apparatus and method for calibration of a temperature sensorÄownload PDF Info Publication number US7309157B1 US7309157B1 US10/952,514 US95251404A US7309157B1 US 7309157 B1 US7309157 B1 US 7309157B1 US 95251404 A US95251404 A US 95251404A US 7309157 B1 US7309157 B1 US 7309157B1 Authority US United States Prior art keywords junction ideality value signal circuit Prior art date Legal status (The legal status is an assumption and is not a legal conclusion. Google Patents US7309157B1 - Apparatus and method for calibration of a temperature sensor US7309157B1 - Apparatus and method for calibration of a temperature sensor